The hysteresis loop and high voltage dielectric breakdown strength testing system is developed based on an improved and optimized dynamic Sawyer-Tower circuit. This system is widely used to measure the relationship between charge density, electric field, and frequency in dielectric and ferroelectric materials.
Features of the hysteresis loop and high voltage dielectric breakdown strength testing system:
1. Integrated system protection circuit: When the sample breaks down during high-voltage testing, it can effectively protect the test system.
2. When used with a Trek high-voltage amplifier for testing, the high voltage is >10kV and the frequency can reach 1000Hz, with the advanced mode reaching 300kHz.
3. High voltage breakdown testing can be performed in AC, DC, or Field endurance life modes, and only requires a simple switch of signal connections.
4. Automatic ferroelectric performance testing until dielectric breakdown occurs.
5. For dielectric material charge and discharge tests, the software can automatically provide the charging energy density, discharging energy density, and charge and discharge efficiency.
6. For life cycle testing (DC mode or AC mode), the system will automatically generate a test summary file.
7. Unique clamp design ensures that even when testing soft polymer dielectric materials, the sample will not be damaged.
8. A powerful software system based on LabVIEW, which allows users to easily control voltage, signal waveforms (triangle wave, sine wave, unipolar, bipolar and arbitrary) and frequency.