Overview
High-performance, modular I/O interfaces are essential for building a successful hardware-in-the-loop (HIL) test system. This Hardware-in-the-Loop (HIL) Test System Architecture tutorial discusses various HIL test system architectures and the real-time processing techniques used for their implementation. This tutorial also discusses a range of I/O interface options that can be used with real-time processors to create your hardware-in-the-loop test system.
Multi-functional I/O
Hardware-in-the-loop (HIL) test systems require a variety of analog, digital, and counter/timer interfaces to interact with the electronic control unit (ECU) under test. NI's versatile digital acquisition products integrate all these functions into a single device, providing a high-value option for HIL test system I/O interfaces. High-performance analog-to-digital and digital-to-analog converters combine onboard processing capabilities for counter/timer functions with low-latency data transfer between real-time processors, making these interfaces ideal for HIL test system applications.
FPGA-based I/O
NI Field-Programmable Gate Array (FPGA)-based I/O integrates analog and digital I/O with the FPGA into a single instrument. These devices utilize NI Reconfigurable I/O (RIO) FPGA technology, which provides programmable FPGA functionality. This allows for the creation of custom I/O functions and reduces the load on the real-time processor for model execution and signal processing, thereby improving the performance of hardware-in-the-loop test systems. Using the NI LabVIEW FPGA module, you can define your own hardware characteristics without requiring in-depth knowledge of hardware description languages.
Deterministic Distributed I/O
NI offers a new suite of deterministic distributed I/O products to help you create I/O-based distributed hardware-in-the-loop test systems, reducing cabling costs and complexity. Choose from a range of I/O modules to create distributed I/O interfaces that communicate with your real-time processor via deterministic Ethernet.
Bus interface
Many ECUs use communication bus interfaces to share information with other devices in the system. NI provides a variety of military/aerospace, automotive, and industrial bus interfaces, and you can also use NI FPGA-based I/O interfaces to implement custom protocols for your hardware-in-the-loop test system.
The NI AIM PXI module selection includes MIL-STD-1553, ARINC 429, and AFDX interfaces. Each module features an onboard application-supported processor, ample onboard memory, and an IRIG-B time code generator/decoder to meet the needs of hardware-in-the-loop test systems. PXI-based modules can utilize the advanced timing and synchronization features provided by the PXI backplane.
The NI CAN and FlexRay interfaces are based on a common API and use an integrated database for importing and editing signals from FIBEX, .DBC, and .NCD files. DeviceNet, Modbus, PROFIBUS, RS232, RS485, and RS422 interfaces are also provided.
Instrument-grade I/O
NI modular instruments provide instrument-level measurement and signal generation in a modular form factor, which you can integrate into hardware-in-the-loop test systems. Choose from a range of digital multimeters (DMMs), oscilloscopes, signal generators, and RF instruments, and then configure them in the software to meet the mission requirements of your specific test system.
Image Acquisition
The NI Smart Camera family offers VGA (640×480 pixels) and SXGA (1280×1024 pixels) resolutions, which can be used to add image analysis to hardware-in-the-loop test systems to verify instrument panel displays or actuator responses. By processing images directly on the onboard PowerPC and digital signal processing (DSP) coprocessor, minimal impact on the hardware-in-the-loop test system can be ensured.
Motion control
NI offers a range of motion control solutions, including high-performance controllers with full functionality for the most complex needs and low-cost motion controllers for point-to-point motion control applications. NI motion control products provide advanced features to help you effectively achieve common tasks such as precise positioning, multi-axis synchronization, and motion at defined speeds, accelerations, or decelerations.
Third-party hardware support
Using the PXI multi-vendor standard, NI provides access to over 1,200 products from more than 70 vendors, ensuring that the NI hardware-in-the-loop platform always meets your hardware-in-the-loop application needs.
Summarize
If you wish to implement hardware fault insertion in a hardware-in-the-loop test system, learn about the available options on the NI hardware-in-the-loop platform.
To complete your hardware-in-the-loop (HIL) test system, and to understand the software technologies used in HIL test system implementation, including test automation, requirements management, modeling, analysis, and reporting, please read Developing Hardware-in-the-Loop (HIL) Test System Applications.
Visit http://www.ni.com/hil/zhs to find more resources to help you develop your hardware-in-the-loop test system, or to learn how others have succeeded using the NI hardware-in-the-loop platform.
