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Generalized testing system technology

2026-04-06 06:48:23 · · #1
Since the 1980s, Beijing Aerospace Measurement and Control Technology Development Company has been committed to ATE/ATS technology research, achieving fruitful results in general testing technology and system integration for electronic equipment. Its general testing system products embody the characteristics of generalization, modularization, intelligence, standardization, digitalization, and networking, completely changing the current situation in China's electronic equipment testing methods, which suffer from low standardization and automation, limited functionality, numerous varieties, and poor maintainability and supportability. These systems have been widely applied in the production and manufacturing of electronic equipment in both military and civilian sectors in China, becoming a powerful tool in the design and manufacturing process of modern equipment systems and an important means of ensuring the design and performance of modern equipment systems. This article mainly provides a concise discussion of the composition, hardware and software, and interface requirements of ATE/ATS from a technical perspective. 1. General Testing System Architecture The generalized automatic test system (ATS) mainly consists of three parts as shown in Figure 1: a main control computer, a bus instrument measurement and control assembly, and a signal conditioning and switching device. The software in the "main control computer" mainly includes the operating system, compiler, and test execution program (TP). The "bus instrument measurement and control assembly" mainly includes modular test and measurement instruments, various control switches, and communication buses. The "Signal Conditioning and Transition Device" mainly includes the conversion and adaptation of various measurement and excitation control signals. The main control computer and system software provide the development and operation environment for the TP (Transmission Technology Unit), and control the test and measurement instruments via the control bus to complete the execution of the TP, retrieve test data, and generate test reports. It is worth mentioning that a general-purpose test system should have an open structure. All components of the system's hardware and software are modularly divided, and the modules should communicate with each other through standard interfaces (or protocols). To ensure system flexibility and fully leverage the creativity of designers, the open system should only be defined at the interface level, without defining the internal implementation of each module. The scalability of system functions and the upgradeability of technology should also be considered. Therefore, both the hardware and software systems, as the two important components of a general-purpose test system, need to have a flexible and open architecture and interface design. 2. General-Purpose Test System Hardware Architecture The key to the hardware design of a general-purpose test system lies in the standardized design of the UUT (Underwriters Interface). The purpose of UUT standardization is to provide a hardware connection structure that allows for easy conversion between multiple UUTs. This structure provides an interface connection method that can operate within a wide frequency band signal range through standardized specifications for mechanical connection mechanisms, connectors, and connectors. This provides strong support for the standardization of general-purpose test systems using VME, VXI, PCI, and PXI bus instruments (IEEE P1505 Adapter Interface (RFI) system standard). Figure 3 is a block diagram of the generalized hardware composition and interface principle. Among them, the Switch Matrix (SWM) interface and the ATS adapter (RFX) interface are important components of the ATS, because the ATS instrument and the UUT are connected through the SWM, and most excitation and measurement signals are applied to the UUT through the RFX. The standard RFX interface restricts the appearance of different types of signals at different locations on the receiver. The SWM enables the connection of various instruments to the multi-functional terminal defined by the standard RFX interface. The standardization of the SWM interface and RFX improves interoperability and reduces reconfiguration costs, ensuring that the ATS instrument required for testing the UUT can be switched to any pin required by the adapter. [b]3 General-Purpose Test System Software Architecture[/b] The software of the automated test system is an important component of the TPS, directly affecting the performance and efficiency of the general-purpose test system. There are also corresponding standards for the automated test software structure. As shown in Figure 3, the open ATS architecture includes various standard open software interface relationships. The Test Foundation Framework (TFF) in IEEE 1226 defines a series of interfaces for developing and executing test programs and test processes. Software functional modules exchange information through these interfaces, and these functional modules with standard interfaces constitute the Test Foundation Framework. However, the standard does not define the implementation of these modules, leaving developers considerable freedom to implement TFFs using languages ​​such as C/C++ or ATLAS. In today's highly developed scientific and technological world, testing is at the forefront of the design and manufacturing of various modern equipment systems, and is a crucial means of ensuring the actual performance indicators of modern equipment systems. General-purpose ATE (Automatic Test Equipment)/ATS (Automatic Test System) technology, representing the highest level of testing technology and instrumentation, relies on commercially available equipment and technologies (Commercial Off The Shelf). Employing open industrial standards, low equipment prices, effective technical support, and the latest commercial products and technologies, it has become an important means of reducing production costs and improving production efficiency in the electronic equipment manufacturing industry. (Edited by: He Shiping)
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